The CITIUS X-ray detector system employs an integral method to measure the signal charge converted from X-ray photons.
Saturation Count Rate
As a performance index, the maximum number of X-ray photons, called the saturation count rate, can be measured in one second. For CITIUS X-ray detector systems, the saturation count rate is inversely proportional to photon energy.
The CITIUS X-ray detector system achieves 600 Mcps at 12 keV. The high count rate makes it possible to upgrade existing experiments. It expects to use in new experimental methods for high-brightness light sources.
High Frame Rate
The frame rate in an image sensor defines as the number of images per second. The higher the speed, the higher the time resolution, and the change in the object can be recorded.
CITIUS, a CMOS image sensor is of the integration type (charge integration type) and can accurately record the amount of signal while operating at high speed. Furthermore, the maximum amount of signal for each frame is as large as 1800 photons/frame, enabling a detailed analysis on a frame-by-frame basis at high speed.
|Sensor material||Silicon (Si)|
|Architecture||Integrating pixel, fast frame readout|
|Sensor Thickness||650 μm|
|Nominal Quantum Efficiency||100 % @ 6 keV|
94 % @ 12 keV
47 % @ 20 keV 
|Pixel Size||72.6 μm x 72.6 μm|
|Format||384 ｘ 728 = 279,552 pixels|
|Image area||27.88 mm x 52.85 mm|
|Noise||60 e- rms.(equivalent to 0.018 photons @ 12 keV)|
|Peak Signal||1,800 photons/pixel/frame @ 12 keV|
|Saturation Count Rate||30 Mcps/pixel @ 12 keV|
600 Mcps/pixel @ 12 keV
|Max Frame Rate||17.4 kHz|
|Energy Range||5 – 30 keV|
(1.5 - 5 keV operation is possible. Please contact us）
 B.L. Henke, et.al., Atomic Data and Nuclear Data Tables Vol. 54 (no.2), 181-342 (July 1993).